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In this paragraph, some circuits using injection locking of self-oscillating signals for oscillation synchronisation or for frequency multiplication or division are described. Injection locking is a nonlinear mechanism that synchronises a free oscillation in a circuit to an externally injected signal. In a linear circuit, signals at different frequencies are independent and coexist in the same circuit without interaction. In a nonlinear circuit, that is, in all practical active circuits, an injected signal interacts with the nonlinear active device, locking the free oscillation frequency to that of the external signal, provided that some conditions are ful lled. In case the conditions are not ful lled, either the two signals coexist in the circuit or the injected one suppresses the free oscillations that disappear altogether. In the following, the basic conditions for injection locking are given, and an overview of the typical behaviour of an injected oscillator will be given, with some applications. Let us consider a generic oscillating circuit similar to that in Figure 5.13 of 5, with an added injected signal (Figure 8.16) [14 17]. Let us assume that

Specify first point: Pass the cursor over 2 and then over 3 to acquire these points. Move the cursor to 4 at the intersection of the two temporary tracking lines and click. Specify next point or [Undo]: Move the cursor in the 270 direction relative to the UCS. 1.25 . Specify next point or [Undo]:

11

In the previous chapter, when you looked at an AutoLISP routine (see Figure 34-4), you saw an example of the COMMAND function. You use the COMMAND function in AutoLISP to execute AutoCAD commands. This function treats all subsequent operands as if they were typed at the command line interactively. When programming COMMAND functions in AutoLISP, exactly duplicate what you would do at the command line. For example, to draw a line, you follow the steps shown in the following table. The second column shows how you would perform the same action in an AutoLISP routine. Enter line at the command line Specify the start point for the line Specify the endpoint Press Enter to end the LINE command

Nanoscale semiconductor SET devices consist of a semiconductor quantum dot (QD) held between two metallic leads (see Fig 66 for an example [406]) The metallic SET was developed in the late 1980s and is considered one of the simplest types of arti cial atoms A metallic SET consists of a metal particle isolated from its leads by two tunnel junctions (which are similar to diodes) and capacitively coupled to a common gate electrode The tunnel junctions create a Coulomb island, which the electrons can enter only by tunneling through one of the insulators Coulomb repulsion prohibits more than one extra electron at a time on the island (near the gate) Hence, electronic circuits can be made to pump or count electrons one at a time.

correlation with performance under environmental conditions cannot be expected For adequate correlation with outdoor exposure, accelerated laboratory conditions should not provide an acceleration factor greater than about 10 Unfortunately, the greater the acceleration, the poorer the correlation Since performance rankings can vary with the amount of radiant exposure, correlation should be determined at an optimum exposure period [149] The extent of correlation may also depend on the property measured as the criterion of degradation Laboratory-accelerated tests have been used primarily for research and development and for quali cations of materials Appropriate laboratory-accelerated tests have the potential of providing information to predict lifetimes under natural weathering conditions, but it is largely an unsolved weathering problem because it is not a simple task The most direct approach is to determine an acceleration factor relating exposure times required for the accelerated and natural weathering tests to produce the same property change.